Product Specification Qualification Test Report

Transcription

1 PS 92 / DMI SM APC Low IL / 9/211 DIAMOND Test & Calibration Laboratory STS 333 / SCS 11 Product Specification Qualification Test Report DMI SM APC Low IL DIAMOND SA Via dei Patrizi 5 CH-6616 LOSONE Tel Fax info@diamond-fo.com

2 - Index Measurement / test Method Page Edition 1) Requalified 2) Similarity 3) Insertion loss, random mated IEC Return loss IEC Mating durability IEC Change of temperature IEC Change of temperature IEC Dry heat IEC Cold IEC Damp heat, cyclic IEC ) Edition: 2) Requalified: 3) Similarity: This column states the date of the Qualification; This column states the date of the Requalification; This column lists the product for which similarity principle has been applied. The present Qualification Test Report (QTR) summarizes the qualification measurements and tests performed to verify the design and the optical, mechanical and environmental performance of the DMI SM APC Low connector at the accredited test & calibration laboratory STS 333 / SCS 11 at Diamond SA, Losone. This current QTR is a summary of the internal qualification report no. 669 performed at the test & calibration laboratory STS 333 / SCS 11 ( The qualification test program of the DMI SM APC Low connector is determined under the guideline of IEC , which defines the minimum requirements and severities which a single-mode connector must satisfy in order to be considered as meeting category U (uncontrolled environment) of IEC The qualified product is subject to periodic requalification with the purpose of guaranteeing the product compliance to the specifications measured in the present report over the years. For requalification purposes the principle of similarity is applied, where the qualification data of similar products can be used if they meet the same technology platform and are manufactured using the same process. For additional information, please contact Diamond or your Diamond Sales Representative. PS 92 / DMI SM APC Low IL / 9/211

3 Insertion loss, random mated Methods: - Insertion loss measurement method B according to IEC Random mating method 1 according to IEC a) Reference measurement: Light Source Mode filter Power Meter b) DUT measurement: Light Source Mode filter Power Meter Grade B: IL Mean.12 db IL 97%.25 db Samples: - DUT: 2 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 1 Diamond DMI SM mating adapter Parameters: - Wavelengths: 131 nm / 155 nm - No. of measurements: 18 Insertion loss IL, random mated [db] at 131 nm at 155 nm Mean value.1.8 Standard deviation % value Maximum value Minimum value.2.2 PS 92 / DMI SM APC Low IL / 9/211 1

4 Return loss Methods: OLCR/OTDR method according to IEC OLCR/ OBR RL Min 7 db Samples: - DUT: 2 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 1 Diamond DMI SM mating adapter Parameters: - Wavelengths: 131 nm / 155 nm - No. of measurements: Return loss RL against reference connector [db] at 131 nm at 155 nm Mean value Standard deviation Maximum value Minimum value > 8 1) 8.8 1) All measured values are beyond the dynamic range of the used instrument. PS 92 / DMI SM APC Low IL / 9/211 2

5 Mating durability Methods: - Insertion loss measurement method B according to IEC Active monitoring of changes in attenuation according to IEC Mating durability test according to IEC Mating / de-mating method IL Max.2 db during test Samples: - DUT: 2 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 1 Diamond DMI SM mating adapter Parameters: - Wavelengths: 131 nm / 155 nm - Monitored channels: 1 - Mating / de-mating cycles: 5 Sample no. maximum value Insertion loss IL [db] minimum value Variation of insertion loss IL [db] at 131 nm at 155 nm at 131 nm at 155 nm at 131 nm at 155 nm PS 92 / DMI SM APC Low IL / 9/211 3

6 Change of temperature Methods: - Insertion loss measurement method B according to IEC Active monitoring of changes in attenuation according to IEC Change of temperature test according to IEC T, RH Climatic chamber IL Max.2 db during test Samples: - DUT: 1 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 5 Diamond DMI SM mating adapters Parameters: - Wavelengths: 131 nm / 155 nm - Monitored channels: 5 - Upper cycling temperature: +7 C - Lower cycling temperature: -25 C - Relative humidity: Not controlled - Dwell time at extreme temperatures: 1 h - Variation of temperature at slopes: 1 C/min - Number of cycles: 12 - Duration: 62 h Variation of insertion loss IL during test [db] at 131 nm at 155 nm Maximum value Minimum value Optical Power at 131 nm [dbm] Optical Power at 155 nm [dbm] PS 92 / DMI SM APC Low IL / 9/211 4

7 Change of temperature Methods: - Insertion loss measurement method B according to IEC Active monitoring of changes in attenuation according to IEC Change of temperature test according to IEC T, RH Climatic chamber IL Max.2 db during test Samples: - DUT: 1 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 5 Diamond DMI SM mating adapters Parameters: - Wavelengths: 131 nm / 155 nm - Monitored channels: 5 - Upper cycling temperature: +85 C - Lower cycling temperature: - C - Relative humidity: Not controlled - Dwell time at extreme temperatures: 1 h - Variation of temperature at slopes: 1 C/min - Number of cycles: 12 - Duration: 74 h Variation of insertion loss IL during test [db] at 131 nm at 155 nm Maximum value.4.8 Minimum value Optical Power t 131 nm [dbm] Optical Power at 155 nm [dbm] PS 92 / DMI SM APC Low IL / 9/211 5

8 Dry heat Methods: - Insertion loss measurement method B according to IEC Active monitoring of changes in attenuation according to IEC Dry heat test according to IEC T, RH Climatic chamber IL Max.2 db during test Samples: - DUT: 1 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 5 Diamond DMI SM mating adapters Parameters: - Wavelengths: 131 nm / 155 nm - Monitored channels: 5 - Constant temperature: +85 C - Relative humidity: Not controlled - Duration: 96 h Variation of insertion loss IL during test [db] at 131 nm at 155 nm Maximum value.4.6 Minimum value Optical Power at 131 nm [dbm] Optical Power at 155 nm [dbm] PS 92 / DMI SM APC Low IL / 9/211 6

9 Cold Methods: - Insertion loss measurement method B according to IEC Active monitoring of changes in attenuation according to IEC Cold test according to IEC T, RH Climatic chamber IL Max.2 db during test Samples: - DUT: 1 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 5 Diamond DMI SM mating adapters Parameters: - Wavelengths: 131 nm / 155 nm - Monitored channels: 5 - Constant temperature: - C - Relative humidity: Not controlled - Duration: 96 h Variation of insertion loss IL during test [db] at 131 nm at 155 nm Maximum value.5.5 Minimum value Optical Power at 131 nm [dbm] Optical Power at 155 nm [dbm] PS 92 / DMI SM APC Low IL / 9/211 7

10 Damp heat, cyclic Methods: - Insertion loss measurement method B according to IEC Active monitoring of changes in attenuation according to IEC Damp heat, cyclic, test according to IEC T, RH Climatic chamber IL Max.2 db during test Samples: - DUT: 1 SM fibre patch cords terminated with - Fibre type: 8.2/125/245/9 m, Diamond art. no Mating adapters: 5 Diamond DMI SM mating adapters Parameters: - Wavelengths: 131 nm / 155 nm - Monitored channels: 5 - Upper cycling temperature: +55 C - Lower cycling temperature: +25 C - Relative humidity: 95% r.h. - Dwell time at extreme temperatures: 9 h - Variation of temperature at slopes: 1 C/h - Number of cycles: 6 - Duration: 144 h Variation of insertion loss IL during test [db] at 131 nm at 155 nm Maximum value.3.3 Minimum value Optical Power at 131 nm [dbm] Optical Power at 155 nm [dbm] PS 92 / DMI SM APC Low IL / 9/211 8